| Product Position |
Entry-Level Universal |
Digital Touch Screen Universal |
Large Component Universal |
Advanced Universal |
Optical Measurement Universal |
| Measurement Methods |
Rockwell / Brinell / Vickers |
Rockwell / Brinell / Vickers |
Rockwell / Brinell / Vickers |
Rockwell / Superficial / Vickers / Brinell |
Rockwell / Superficial / Brinell / Vickers / Knoop |
| Display Type |
Analogue Gauge |
Touch Screen Display |
8" Industrial Touch Screen |
8" Industrial Touch Screen |
Industrial Optical Touch Screen |
| Loading System |
Electronic |
Automatic |
Automatic Closed-Loop |
Closed-Loop Force Feedback |
Closed-Loop Load Cell |
| Operation Type |
Electronic Manual |
Semi-Automatic |
Semi-Automatic |
Automatic |
Optical Manual / Optical Automatic |
| Resolution |
0.5HR |
0.1HR |
Digital High Resolution |
0.02μm Sounding Resolution |
Optical Digital Resolution |
| Data Storage |
No |
Yes |
Yes |
Advanced Data Storage |
Advanced Optical Data Storage |
| Data Output |
No |
USB Output |
USB / RS232 |
USB / LAN / WiFi / Bluetooth |
Integrated Optical Software |
| Integrated Software |
No |
Basic Digital Functions |
Built-In Printer & Digital Functions |
HD SPIRIT Software |
Optical Measurement Software |
| Optical System |
Basic Microscope |
Digital Measuring Eyepiece |
Microscope 25x / 50x / 100x |
Digital Depth Method |
5MP Camera + Optical Zoom |
| Test Force Control |
Electronic Motor |
Automatic |
Closed-Loop |
Closed-Loop Force Feedback |
Closed-Loop Force Feedback |
| Max Specimen Height |
175mm |
240mm |
280mm |
300mm |
300mm |
| Throat Depth |
165mm |
170mm |
200mm |
200mm |
150mm |
| Typical Applications |
Workshops & Education |
Industrial QC |
Large Components |
Advanced QC Laboratories |
Research & Advanced Laboratories |
| Main Differentiator |
Affordable Universal Testing |
Digital Touch Screen Workflow |
Large Specimen Capability |
Depth Method & Automation |
Optical Measurement & Automation |
| Standards |
ASTM / ISO / JIS |
ASTM / ISO / JIS |
ASTM / ISO / JIS |
ASTM / ISO / JIS |
ASTM / ISO / JIS |